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1

[IEEE 2019 Devices for Integrated Circuit (DevIC) - Kalyani, India (2019.3.23-2019.3.24)] 2019 Devices for Integrated Circuit (DevIC) - A Low Power LNA using Current Reused Technique for UWB Application

Tripathy, Dhananjaya, Nayak, Debasish, Biswal, Sudhansu Mohan, Swain, Sanjit Kumar, Baral, Biswajit, Das, Satish Kumar

Year:

2019

Language:

english

File:

PDF, 388 KB

english, 2019

2

[IEEE 2019 Devices for Integrated Circuit (DevIC) - Kalyani, India (2019.3.23-2019.3.24)] 2019 Devices for Integrated Circuit (DevIC) - Performance Analysis of Staggered Heterojunction based SRG TFET biosensor for health IoT application

Biswal, Sudhansu Mohan, Swain, Sanjit Kumar, Baral, Biswajit, Nayak, Debasish, Nanda, Umakanta, Das, Satish Kumar, Tripthy, Dhananja

Year:

2019

Language:

english

File:

PDF, 566 KB

english, 2019

3

[IEEE 2019 Devices for Integrated Circuit (DevIC) - Kalyani, India (2019.3.23-2019.3.24)] 2019 Devices for Integrated Circuit (DevIC) - Effect of High-K Spacer on the Performance of Non-Uniformly doped DG-MOSFET

Swain, Sanjit K, Das, Satish K, Biswal, Sudhansu M, Adak, Sarosij, Nanda, Umakanta, Sahoo, Asmit Amlan, Navak, Debasish, Baral, Biswajit, Tripathy, Dhananjaya

Year:

2019

Language:

english

File:

PDF, 386 KB

english, 2019

4

Use of transverse beam polarization to probe anomalous VVH interactions at a Linear Collider

Sudhansu S. Biswal, Rohini M. Godbole

Journal:

Physics Letters B

Year:

2009

Language:

english

File:

PDF, 282 KB

english, 2009

5

AnomalousVVHinteractions at a linear collider

Sudhansu S. Biswal, Debajyoti Choudhury, Rohini M. Godbole, Ritesh K. Singh

Journal:

Year:

2007

Language:

english

File:

PDF, 172 KB

english, 2007

6

at the Tevatron

Biswal, Sudhansu S., Mitra, Subhadip, Santos, Rui, Sharma, Pankaj, Singh, Ritesh K., Won, Miguel

Journal:

Physical Review D

Year:

2012

Language:

english

File:

PDF, 566 KB

english, 2012

7

Role of polarization in probing anomalous gauge interactions of the Higgs boson

Biswal, Sudhansu S., Choudhury, Debajyoti, Godbole, Rohini M., Mamta,

Journal:

Physical Review D

Year:

2009

Language:

english

File:

PDF, 480 KB

english, 2009

8

Top quark forward-backward asymmetry at the Tevatron and its implications at the LHC

Bhattacherjee, Biplob, Biswal, Sudhansu S., Ghosh, Diptimoy

Journal:

Physical Review D

Year:

2011

Language:

english

File:

PDF, 481 KB

english, 2011

9

Probing chromomagnetic and chromoelectric couplings of the top quark using its polarization in pair production at hadron colliders

Biswal, Sudhansu S., Rindani, Saurabh D., Sharma, Pankaj

Journal:

Physical Review D

Year:

2013

Language:

english

File:

PDF, 752 KB

english, 2013

10

interactions at a linear collider [Phys. Rev. D 73 , 035001 (2006)]

Biswal, Sudhansu S., Choudhury, Debajyoti, Godbole, Rohini M., Singh, Ritesh K.

Journal:

Physical Review D

Year:

2006

File:

PDF, 28 KB

2006

11

interactions at a linear collider

Biswal, Sudhansu S., Choudhury, Debajyoti, Godbole, Rohini M., Singh, Ritesh K.

Journal:

Physical Review D

Year:

2006

Language:

english

File:

PDF, 517 KB

english, 2006

12

Collider

Biswal, Sudhansu S., Godbole, Rohini M., Mellado, Bruce, Raychaudhuri, Sreerup

Journal:

Physical Review Letters

Year:

2012

Language:

english

File:

PDF, 194 KB

english, 2012

13

Analytical subthreshold modeling of dual material gate engineered nano-scale junctionless surrounding gate MOSFET considering ECPE

Biswal, Sudhansu Mohan, Baral, Biswajit, De, Debashis, Sarkar, Angsuman

Journal:

Superlattices and Microstructures

Year:

2015

Language:

english

File:

PDF, 1.57 MB

english, 2015

14

η c production at the Large Hadron Collider

Biswal, Sudhansu S, Sridhar, K

Journal:

Journal of Physics G Nuclear and Particle Physics

Year:

2012

Language:

english

File:

PDF, 1.63 MB

english, 2012

15

Study of effect of gate-length downscaling on the Analog/RF performance and Linearity Investigation of InAs-based nanowire Tunnel FET

Biswal, Sudhansu Mohan, Baral, Biswajit, De, Debashis, Sarkar, Angsuman

Journal:

Superlattices and Microstructures

Year:

2016

Language:

english

File:

PDF, 1.01 MB

english, 2016

16

Effect of gate-length downscaling on the analog/RF and linearity performance of InAs-based nanowire tunnel FET

Baral, Biswajit, Biswal, Sudhansu Mohan, De, Debashis, Sarkar, Angsuman

Journal:

International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

Year:

2016

Language:

english

File:

PDF, 771 KB

english, 2016

17

Radio frequency/analog and linearity performance of a junctionless double gate metal–oxide–semiconductor field-effect transistor

Baral, Biswajit, Biswal, Sudhansu Mohan, De, Debashis, Sarkar, Angsuman

Journal:

SIMULATION: Transactions of the Society for Modeling and Simulation

Year:

2017

Language:

english

File:

PDF, 4.13 MB

english, 2017

18

collider

Biswal, Sudhansu S., Dev, P. S. Bhupal

Journal:

Physical Review D

Year:

2017

Language:

english

File:

PDF, 316 KB

english, 2017

19

[IEEE 2017 Devices for Integrated Circuit (DevIC) - Kalyani, India (2017.3.23-2017.3.24)] 2017 Devices for Integrated Circuit (DevIC) - Analog/radiofrequency and linearity performance of staggered heterojunction nanowire(nw) tunnel FET for low power application

Biswal, Sudhansu Mohan, Baral, Biswajit, De, Debashis

Year:

2017

Language:

english

File:

PDF, 1.41 MB

english, 2017

20

Simulation and comparative study on analog/RF and linearity performance of III–V semiconductor-based staggered heterojunction and InAs nanowire(nw) Tunnel FET

Biswal, Sudhansu Mohan, Baral, Biswajit, De, Debashis, Sarkar, A.

Journal:

Microsystem Technologies

Year:

2017

Language:

english

File:

PDF, 2.32 MB

english, 2017

21

[IEEE 2017 Devices for Integrated Circuit (DevIC) - Kalyani, India (2017.3.23-2017.3.24)] 2017 Devices for Integrated Circuit (DevIC) - Performance investigation of III-V heterosturucture underlap double gate MOSFET for System-On-Chip application

Baral, Biswajit, Biswal, Sudhansu Mohan, Jena, Satyabrata, De, Debashis

Year:

2017

Language:

english

File:

PDF, 455 KB

english, 2017

22

A Comparison of Machinability in Hard Turning of EN-24 Alloy Steel Under Mist Cooled and Dry Cutting Environments with a Coated Cermet Tool

Das, Anshuman, Tirkey, Nirmal, Patel, Saroj Kumar, Das, Sudhansu Ranjan, Biswal, Bibhuti Bhusan

Journal:

Journal of Failure Analysis and Prevention

Year:

2018

Language:

english

File:

PDF, 3.20 MB

english, 2018

23

[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Performance Analysis of Down Scaling Effect of Si based SRG Tunnel FET

Biswal, Sudhansu Mohan, Baral, Biswajit, Swain, Sanjit Kumar, Kumar Pati, Sudhansu

Year:

2018

Language:

english

File:

PDF, 975 KB

english, 2018

24

[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Study of Effect of downscaling on the Analog/RF Performance of Gate all Around JLMOSFET

Misra, Sarita, Mohan Biswal, Sudhanshu, Bara, Biswajit, Kumar Swain, Sanjit, Kumar Pati, Sudhansu

Year:

2018

File:

PDF, 35 KB

2018

25

[IEEE 2019 Devices for Integrated Circuit (DevIC) - Kalyani, India (2019.3.23-2019.3.24)] 2019 Devices for Integrated Circuit (DevIC) - RF/Analog & Linearity performance analysis of a downscaled JL DG MOSFET on GaAs substrate for Analog/mixed signal SOC applications

Baral, Biswajit, Biswal, Sudhansu Mohan, Swain, Sanjit, Das, Satish Kumar, Nayak, Debasish, Tripathy, Dhananjaya

Year:

2019

File:

PDF, 539 KB

2019

26

[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Comparison of Linearity Performance of InAs Based DG-MOSFETs with Gate Stack, SiO2 and HfO2

Swain, Sanjit Kumar, Adak, Sarosij, Biswal, Sudhansu Mohan, Baral, Biswajit, Parija, Saradiya

Year:

2018

Language:

english

File:

PDF, 979 KB

english, 2018

27

Performance appraisal of various nanofluids during hard machining of AISI 4340 steel

Das, Anshuman, Pradhan, Omprakash, Patel, Saroj Kumar, Das, Sudhansu Ranjan, Biswal, Bibhuti Bhusan

Journal:

Journal of Manufacturing Processes

Year:

2019

Language:

english

File:

PDF, 2.45 MB

english, 2019

28

Experimental investigation of various machining attributes and cost estimation during machining of hardened AISI 4340 steel with untreated and cryo treated cermet inserts

Das, Anshuman, Das, Sudhansu Ranjan, Patel, Saroj Kumar, Biswal, Bibhuti Bhusan

Journal:

Mechanics & Industry

Year:

2020

File:

PDF, 8.79 MB

2020

29

Assessment of factors influencing the elution of chromium from ferrochromium slag using factorial design of experiment

Sekhar Biswal, Sudhansu, Panda, Chittaranjan, Sahoo, Sudarsan, Jena, Trilochan, Chandra Panda, Kishor

Journal:

Materials Today: Proceedings

Year:

2020

File:

PDF, 1.07 MB

2020

30

Entrapment of chromium in cement with waste material

Biswal, Sudhansu Sekhar, Panda, Chittaranjan, Sahoo, Sudarsan, Jena, Trilochan

Journal:

Materials Today: Proceedings

Year:

2020

File:

PDF, 1.58 MB

2020

31

Analytical modelling of a Cyl-JLAM MOSFET in the subthreshold region using distinct device geometry

Misra, Sarita, Biswal, Sudhansu Mohan, Baral, Biswajit, Swain, Sanjit Kumar, Sarkar, Angsuman, Pati, Sudhansu Kumar

Journal:

Journal of Computational Electronics

Year:

2020

File:

PDF, 2.80 MB

2020